با سلام خدمت کاربران در صورتی که با خطای سیستم پرداخت بانکی مواجه شدید از طریق کارت به کارت (6037997535328901 بانک ملی ناصر خنجری ) مقاله خود را دریافت کنید (تا مشکل رفع گردد).
دسته بندی:
هوش مصنوعی - Artificial intelligence
سال انتشار:
2020
عنوان انگلیسی مقاله:
AI Powered THz VLSI Testing Technology
ترجمه فارسی عنوان مقاله:
فناوری تست THz VLSI با قدرت هوش مصنوعی
منبع:
IEEE - 2020 IEEE 29th North Atlantic Test Workshop (NATW);2020; ; ;
نویسنده:
Naznin Akter , Mustafa Karabiyik , Michael Shur , John Suarez , Nezih Pala
چکیده انگلیسی:
Abstract—Increasing complexity of digital and mixed-signal
systems makes establishing the authenticity of a chip to be a
challenging problem. We present a new terahertz testing technique
for non-destructive identification of genuine integrated circuits, in
package, in-situ and either with no or under bias, by measuring
their response to scanning terahertz and sub-terahertz radiation at
the circuit pins. This novel, patent pending non-invasive nondestructive
technology when merged with Artificial Intelligence
(AI) engine will evolve and self-improve with each test cycle. By
establishing and AI processing of the THz scanning signatures of
reliable devices and circuits and comparing this signatures with
devices under test using AI, this technology could be also used for
reliability and lifetime prediction.
Keywords: Terahertz | hardware cybersecurity | reliability | authentication | artificial intelligence
قیمت: رایگان
توضیحات اضافی:
تعداد نظرات : 0