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AI Powered THz VLSI Testing Technology
فناوری تست THz VLSI با قدرت هوش مصنوعی-2020 Abstract—Increasing complexity of digital and mixed-signal
systems makes establishing the authenticity of a chip to be a
challenging problem. We present a new terahertz testing technique
for non-destructive identification of genuine integrated circuits, in
package, in-situ and either with no or under bias, by measuring
their response to scanning terahertz and sub-terahertz radiation at
the circuit pins. This novel, patent pending non-invasive nondestructive
technology when merged with Artificial Intelligence
(AI) engine will evolve and self-improve with each test cycle. By
establishing and AI processing of the THz scanning signatures of
reliable devices and circuits and comparing this signatures with
devices under test using AI, this technology could be also used for
reliability and lifetime prediction. Keywords: Terahertz | hardware cybersecurity | reliability | authentication | artificial intelligence |
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